P4C214-25GR52B
PERFORMANCE SEMICONDUCTOR CORP
- 生命周期状态Discontinued
- 说明Cache SRAM, 16KX16, 25ns, CMOS, CQCC52
- 类别
- ECCN3A001.a.2.c
- ECCN GovernanceEAR
- HTS Code8542.32.00.41
- SB Code8542.32.00.40
- I/O TypeCOMMON
- TechnologyCMOS
- JESD-30 CodeS-CQCC-J52
- Memory Width16
- Package CodeQCCJ
- Output EnableYES
- Package ShapeSQUARE
- Package StyleCHIP CARRIER Meter
- Surface MountYES
- Terminal FormJ BEND
- J-STD-609 Codee0
- Memory IC TypeCACHE SRAM
- Operating ModeASYNCHRONOUS
- Number of Ports1
- Parallel/SerialPARALLEL
- Terminal FinishTin/Lead (Sn/Pb)
- DLA QualificationNot Qualified
- Temperature GradeMILITARY
- Terminal PositionQUAD
- Additional FeatureADDRESS LATCH; 2-WAY 8K X 16
- Memory Organization16KX16
- Number of Functions1
- Number of Terminals52
- Terminal Pitch (mm)1.27
- Access Time-Max (ns)25
- Number of Words Code16K
- Memory Density (bits)262144
- Package Body MaterialCERAMIC, METAL-SEALED COFIRED
- Output Characteristics3-STATE
- Supply Voltage-Max (V)5.5
- Supply Voltage-Min (V)4.5
- Supply Voltage-Nom (V)5
- Number of Words (words)16384
- Standby Current-Max (A)0.36
- Standby Voltage-Min (V)4.5
- Supply Current-Max (mA)360
- Package Equivalence CodeLDCC52,.8SQ
- Operating Temperature-Max (Cel)125
- Operating Temperature-Min (Cel)-55
- Screening Level / Reference Standard38535Q/M;38534H;883B
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P4C214-25GR52B