K4H561638J-HICC
Samsung Semiconductor, Inc.
- 生命周期状态Discontinued
- RoHS符合RoHS标准
- 说明DDR1 DRAM, 16MX16, 0.65ns, CMOS, PBGA60
- 类别
- ECCNEAR99
- ECCN GovernanceEAR
- HTS Code8542.32.00.24
- SB Code8542.32.00.15
- I/O TypeCOMMON
- TechnologyCMOS
- JESD-30 CodeR-PBGA-B60
- Memory Width16
- Organization16MX16
- Package CodeBGA
- JESD-609 Codee3
- Package ShapeRECTANGULAR
- Package StyleGRID ARRAY Meter
- Surface MountYES
- Terminal FormBALL
- Memory Density268435456 bit
- Memory IC TypeDDR1 DRAM
- Refresh Cycles8192
- Terminal Pitch0.8 mm
- Access Time-Max0.65 ns
- Number of Words16777216 words
- Terminal FinishMATTE TIN
- Temperature GradeINDUSTRIAL
- Terminal PositionBOTTOM
- Supply Current-Max290 mA
- Number of Terminals60
- Standby Current-Max0.004 Amp
- Number of Words Code16M
- Qualification StatusNot Qualified
- Package Body MaterialPLASTIC/EPOXY
- Output Characteristics3-STATE
- Sequential Burst Length2,4,8
- Interleaved Burst Length2,4,8
- Package Equivalence CodeBGA60,9X12,40/32
- Operating Temperature-Max85 Cel
- Operating Temperature-Min-40 Cel
- Supply Voltage-Nom (Vsup)2.6 V
- Clock Frequency-Max (fCLK)200 MHz
- Moisture Sensitivity Level1
K4H561638J-HICC有0家供应商货源可供购买或竞价
提交询价
您的询价单将直接发送给我们的销售专家: Pari
提交询价
K4H561638J-HICC